HOME > News > 2003 > TEL and Inovys Reach Wafer Probe Milestone on Ocelot ATE-Over a million devices tested on undisclosed customer production line with substantially lower cost of test

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Sep 30, 2003

TEL and Inovys Reach Wafer Probe Milestone on Ocelot ATE-Over a million devices tested on undisclosed customer production line with substantially lower cost of test

Austin, TX -- At the International Test Conference, Inovys and TEL today disclosed an integrated wafer probe test cell, in production at an undisclosed mutual customer location, which has recently surpassed the milestone of testing more than one million devices.

The interface enables production wafer probing on a TEL P-8XL with an Inovys Ocelot test system; the first time the award-winning tester has been used in a wafer production sort operation. Introduced last year at the International Test Conference, the Ocelot tester received the prestigious 2003 Best in Test award from the editors of Test & Measurement World magazine.

The Ocelot Tester may be configured with up to 1536 pins and over 100 independent power supplies to enable extended parallel test economies. Using a jointly developed interface to the TEL P-8XL, the combined Inovys – TEL production solution is dramatically lowering the cost of test for complex semiconductor devices.

"Time to market considerations mandate that wafer probe attain higher levels of quality and cost effectiveness," said Maverick Brown, TEL product marketing manager. "By linking the proven high availability and throughput of the TEL P-8XL with the new structural test capabilities of the Inovys Ocelot family, semiconductor manufacturers have substantially lowered their cost of wafer test."

"Our Web site has spreadsheets which calculate that DFT enabled devices can enjoy a 5-10x cost reduction in probe test cost," said Peter G.H. Hwang, marketing director at Inovys. "By utilizing TEL's leading-edge probe capability, along with Ocelot's advanced structural test capability and high pin count, you can deploy highly parallel techniques that can provide substantial cost reductions beyond just lower capital."


About Inovys Corporation

Inovys Corporation supplies advanced test solutions for semiconductor manufacturers who require economical structured ATE systems and EDA-to-Test software. Inovys has pioneered the low-cost desktop tester, which combines seamless ATPG-ATE-EDA integration with advanced failure analysis tools utilizing DFT methodology. Inovys is headquartered in Pleasanton, CA, with offices in Austin, Texas. Personal Ocelot, Stylus, FlopPlot, and Inovys are trademarks of Inovys Corporation. http://www.Inovys.com or 925.924.9110.



Peter Hwang
Marketing Director
Inovys Corporation
Telephone: 925-924-9110
Fax: 925-924-9118
Peter_GH_Hwang@inovys.com

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