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Dec 2, 2005 TEL and IMEC Extend Lithography Collaboration to EUV and Hyper NA 193nm Immersion LithographyTOKYO Tokyo Electron Limited (TEL) announced today an extension to its collaboration on research into advanced lithography technologies with IMEC, a world-leading independent research center in nanoelectronics and nanotechnology. TEL will install two 300mm CLEAN TRACK systems at IMEC in 2006. The coater/developers will be used for research into EUV Lithography and Hyper NA 193nm Immersion Lithography EUV lithography is widely expected to become the successor to 193nm immersion lithography in advanced patterning techniques, potentially to be introduced for the 32nm node. Although it is likely that the implementation of this technology for semiconductor device manufacturing is still some years away, there are many challenges to overcome. The objective of the joint activity between TEL and IMEC on EUV lithography is to understand the nature of such challenges related to photoresist processing, and to identify potential solutions to these challenges. As an extension of the current collaboration on immersion lithography, TEL will also install a state of the art CLEAN TRACKTM LITHIUSTM i+ system for Hyper NA 193nm Immersion Lithography in Q1/2006. This tool will feature technologies specific to immersion lithography developed as a result of defectivity work carried out by IMEC and TEL using the CLEAN TRACK ACTTM12 currently installed at IMEC. The LITHIUS i+ will be interfaced to IMEC's ASML XT1700i to form a world leading immersion lithography cluster. This will bring the total number of TEL's CLEAN TRACK systems installed at IMEC's facilities in Leuven to nine. This significant installed base represents the value that TEL places on working in collaboration with IMEC, as well as reflecting IMEC's status as a world leader in semiconductor technology research. High expectations are placed on the combination of IMEC's advanced research capabilities and TEL's technological expertise on photoresist processing. TEL will apply knowledge gained on critical dimension and defectivity control for EUV processes to its products, enabling TEL to provide fit-for-purpose technology to customers in a timely manner. *1 CLEAN TRACK is a registered trademark of Tokyo Electron Limited.
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